Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Wireless radio frequency technique design and method for testing of integrated circuits and wafers

Wireless radio frequency technique design and method for testing of integrated circuits and wafers

US Patent 7183788 · Granted Feb 27, 2007

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Optical interrogator for performing interferometry using fiber Bragg gratings2024
Optical interrogator for performing interferometry using fiber Bragg gratings2023
Optical interrogator for performing interferometry using fiber Bragg gratings2021
Optical interrogator for performing interferometry using Bragg gratings2021
Network-based IP configuration recovery2020
Optical interrogator for performing interferometry using fiber Bragg gratings2019
Redundant pathways for network elements2018
Network-based DHCP server recovery2016
Wireless sensor device2016
Highly scalable OSPF routing in support of full mesh optical networks2015
Testing of electronic circuits using an active probe integrated circuit2015
Method and apparatus for interrogating electronic equipment components2014