Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Method for analyzing fail bit maps of wafers

Method for analyzing fail bit maps of wafers

US Patent 7138283 · Granted Nov 21, 2006

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Ion implanter and ion implantation method2024
Semiconductor device and method of manufacturing the same2023
Ion implanter and ion implantation method2023
Semiconductor storage device2022
Semiconductor memory device and method of manufacturing the same2021
Wearable device and time correction method2021
Ion implanter2021
Information processing device, information processing system, control method of 2020
Ion implanter and ion implantation method2019
Ion implanter, ion beam irradiated target, and ion implantation method2019
Three-dimensional image processing system, three-dimensional image processing ap2018
Abnormality portent detection system and method of manufacturing semiconductor d2018