Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Smartcard test system and related methods

Smartcard test system and related methods

US Patent 7127649 · Granted Oct 24, 2006

Estimated economic value: $4,161,000 ⓘ

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Smart card with self-detachment features and related methods2012
Smart card with selectively allocatable data buffers and associated methods2012
Smart card with self-detachment features and related methods2011
Smart card with self-reconfiguration features and related methods2011
Smart card with enhanced security features and related system, integrated circui2008
Multi-mode smart card emulator and related methods2008
Smart card providing data mapping for multiple applications and related methods2008
Universal serial bus (USB) smart card having enhanced testing features and relat2007
Smart card for performing advance operations to enhance performance and related 2006
Smart card including a JTAG test controller and related methods2006
Smart card emulator and related methods using buffering interface2006
Universal serial bus (USB) smart card having read back testing features and rela2004