Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Method and circuit for reducing defect current from array element failures in random access memories

Method and circuit for reducing defect current from array element failures in random access memories

US Patent 7095642 · Granted Aug 22, 2006

Estimated economic value: $5,731,000 ⓘ

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Mobile ophthalmoscope2024
Temperature and process driven reference2012
Bank re-assignment in chip to reduce IR drop2012
DRAM positive wordline voltage compensation device for array device threshold vo2011
Method for reducing leakage current of a memory and related device2011
Method for reducing power consumption in a volatile memory and related device2010
Dual-voltage wordline drive circuit with two stage discharge2008
Dual-voltage wordline drive circuit with two stage discharge2008
Sense amplifier circuit and method of operation2008
Sense amplifier circuit and method of operation2008
Sense amplifier circuit and method2007
Sense amplifier circuit and method2007