Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Method and apparatus for measuring wavelength changes in a high-resolution measurement system

Method and apparatus for measuring wavelength changes in a high-resolution measurement system

US Patent 7088441 · Granted Aug 8, 2006

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Metrology system with position and orientation tracking utilizing light beams2024
Metrology system with position and orientation tracking utilizing light beams2024
Encoder2023
Supplementary metrology position coordinates determination system including an a2023
Supplementary metrology position coordinates determination system including an a2023
Metrology system configured to measure apertures of workpieces2023
Rotating chromatic range sensor system with calibration objects and method2022
Rotating chromatic range sensor system with calibration object and method2021
Triangulation sensing system and method with triangulation light extended focus 2021
Tunable acoustic gradient lens system with reflective configuration and increase2021
Robot system with supplementary metrology position determination system2021
Robot system with end tool metrology position coordinates determination system2021