Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Automatic monitoring and statistical analysis of dynamic process metrics to expose meaningful changes

Automatic monitoring and statistical analysis of dynamic process metrics to expose meaningful changes

US Patent 7072899 · Granted Jul 4, 2006

Assignee

No assignee recorded.

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Computer-implemented method, system, apparatus for generating user's insight sel2007
Method and apparatus for navigating and displaying data points stored in a multi2000
Xbase transaction processing system1999