Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Method and apparatus for measuring a device under test using an improved through-reflect-line measurement calibration

Method and apparatus for measuring a device under test using an improved through-reflect-line measurement calibration

US Patent 7068049 · Granted Jun 27, 2006

Estimated economic value: $9,748,000 ⓘ

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Method and system for calibrating a measurement device path and for measuring a 2007
Method, apparatus, and article of manufacture for manufacturing high frequency b2006
Method and apparatus for performing a minimum connection multiport through-refle2006
Method and system for calibrating a measurement device path and for measuring a 2006
Method, apparatus, and article of manufacture for characterizing a device and pr2005
Method and apparatus for calibrating a multiport test system for measurement of 2005
Method and apparatus for performing multiport through-reflect-line calibration a2005
Method and apparatus for calibrating a multiport test system for measurement of 2004
Method, apparatus, and article of manufacture for predicting electrical behavior2004
Method and apparatus for linear characterization of multi-terminal single-ended 2003
Method and apparatus for providing and calibrating a multiport network analyzer1996
Electronic calibration method and apparatus1996