Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Concurrently programmable dynamic memory built-in self-test (BIST)

Concurrently programmable dynamic memory built-in self-test (BIST)

US Patent 7062694 · Granted Jun 13, 2006

Estimated economic value: $5,924,000 ⓘ

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Testing multi-core processors2012
Built-in self-test (BIST) of memory interconnect2006
Built-in self-test (BIST) of memory interconnect2006
Method and apparatus for generating and verifying libraries for ATPG tool2006
Method and apparatus for generating and verifying libraries for ATPG tool2006
Instruction-based built-in self-test (BIST) of external memory2006
Instruction-based built-in self-test (BIST) of external memory2006
Method and apparatus for generating test pattern for integrated circuit design2005
Method and apparatus for generating test pattern for integrated circuit design2005
Bus signal hold cell, bus system, and method2004