Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Method and a test setup for measuring large-signal S-parameters that include the coefficients relating to the conjugate of the incident waves

Method and a test setup for measuring large-signal S-parameters that include the coefficients relating to the conjugate of the incident waves

US Patent 7038468 · Granted May 2, 2006

Assignee

No assignee recorded.

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Phase distortion measurement2024
Method and apparatus for characterizing homodyne transmitters and receivers2022
Method and apparatus for reducing non-linear distortion2021
Measurement of periodically modulated signals under non-coherent operating condi2021
Nonlinear distortion detection2020
Method for measuring frequency offset between an RF transmitter and a test recei2020
Method and system for characterizing, modeling and simulating non-linear compone2019
Method and system of preventing interference caused by images2018
Method and apparatus for characterizing local oscillator path dispersion2017
Method and apparatus for spectral stitching discontinuous spectra using referenc2017
Method and apparatus for spectral stitching using reference channel and a pilot 2017
Method and system for characterizing phase dispersion in intermediate frequency 2016