Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Jitter measurement using mixed down topology

Jitter measurement using mixed down topology

US Patent 7035325 · Granted Apr 25, 2006

Estimated economic value: $17,957,000 ⓘ

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Precision, high bandwidth, switching attenuator2025
Current monitor combining a shunt resistor with a Rogowski coil2025
Isolated probe tip2025
Analog signal isolator2025
Current shunt probe2025
Test and measurement instrument accessory with reconfigurable processing compone2023
Precision, high bandwidth, switching attenuator2023
Analog signal isolator2023
Test and measurement devices, systems and methods associated with augmented real2023
Discrete offset dithered waveform averaging for high-fidelity digitization of re2023
Frequency converter accessory for a test and measurement instrument2023
Calibration of magnetic field sensor for current probe2023