{"@context": "https://schema.org", "@type": "BreadcrumbList", "itemListElement": [{"@type": "ListItem", "position": 1, "name": "Home", "item": "https://www.patentleaderboard.com/"}, {"@type": "ListItem", "position": 2, "name": "Test system for identification and sorting of integrated circuit devices", "item": "https://www.patentleaderboard.com/patent/6990387"}]}

Home › Test system for identification and sorting of integrated circuit devices

Test system for identification and sorting of integrated circuit devices

US Patent 6990387 · Granted Jan 24, 2006

Estimated economic value: $23,406,000 ⓘ

Assignee

Intel

Inventors

Nicholas J. Freij (1 patents)
Ryan D. Anderson (4 patents)
Gary A. Andrew (3 patents)
Abderrahim Doukali (1 patents)

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