Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Measurement probe, in particular for an apparatus for measurement of the thickness of thin layers

Measurement probe, in particular for an apparatus for measurement of the thickness of thin layers

US Patent 6977498 · Granted Dec 20, 2005

Assignee

No assignee recorded.

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Device and method for measuring mechanical properties of materials2013
Hand-held device for non-destructive thickness measurement2007
Process and device for aerating a liquid with gas2006
Process for aerating dispersions2005
Process and device for separating impurities from a suspension by flotation2004
Device for aerating dispersions2003
Process for aerating dispersions2002
Orthopedic device for treating hip displeasure and hip luxation1985
Control circuit for a stepping motor in battery-operated instruments1983
Electronic clock with a chime system1981