Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Universally accessible fully programmable memory built-in self-test (MBIST) system and method

Universally accessible fully programmable memory built-in self-test (MBIST) system and method

US Patent 6959256 · Granted Oct 25, 2005

Estimated economic value: $17,351,000 ⓘ

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Method and apparatus for testing embedded cores2009
Method and apparatus for testing embedded cores2007
Insertion of scan hardware2004
High performance, low power, scannable flip-flop2002
Graphical user interface for testability operation2002