Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Scanning probe based lithographic alignment

Scanning probe based lithographic alignment

US Patent 6955767 · Granted Oct 18, 2005

Estimated economic value: $13,285,000 ⓘ

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Adjustable platform for installing wind turbine generator2025
Power control method for wind power and photovoltaic combined power generation2024
Synaptic resistors for concurrent parallel signal processing, memory and learnin2022
Wall smoothness, feature accuracy and resolution in projected images via exposur2016
Nanoscale electric lithography2013
Memory capacitor made from field configurable ion-doped materials2013
Bioassays based on polymeric sequence probe2013
Nanoscale electric lithography2008
Support volume calculation for a CAD model2005