Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Methods and systems for determining a thickness of a structure on a specimen and at least one additional property of the specimen

Methods and systems for determining a thickness of a structure on a specimen and at least one additional property of the specimen

US Patent 6950196 · Granted Sep 27, 2005

Estimated economic value: $28,686,000 ⓘ

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Intraocular lens injector2025
Intraocular lens injector2025
Tunable DUV laser assembly2025
Electron gun and electron microscope2025
Photo-cleavable surfactants2025
Strategy enabled by a photo-cleavable surfactant for extracellular vesicle prote2024
Protective coating for nonlinear optical crystal2024
Back-illuminated sensor with boron layer deposited using plasma atomic layer dep2024
Deep ultraviolet laser using strontium tetraborate for frequency conversion2024
Continuous degenerate elliptical retarder for sensitive particle detection2024
Back-illuminated sensor and a method of manufacturing a sensor using a silicon o2023
United states frequency conversion using interdigitated nonlinear crystal gratin2023