Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Scan method for built-in-self-repair (BISR)

Scan method for built-in-self-repair (BISR)

US Patent 6928598 · Granted Aug 9, 2005

Estimated economic value: $4,046,000 ⓘ

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

BISR mode to test the redundant elements and regular functional memory to avoid 2011
BISR mode to test the redundant elements and regular functional memory to avoid 2011
Accurate pin-based memory power model using arc-based characterization2009
Hard BISR scheme allowing field repair and usage of reliability controller2009
Hard BISR scheme allowing field repair and usage of reliability controller2009
Method and system for performing built-in-self-test routines using an accumulato2009
Method and system for performing built-in-self-test routines using an accumulato2009
Accurate pin-based memory power model using arc-based characterization2008
Reconfiguring a RAM to a ROM using layers of metallization2007
Method and apparatus for separating native, functional and test configurations o2007
Method and system for performing built-in self-test routines using an accumulato2007
Method and system for performing built-in self-test routines using an accumulato2007