Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Test system for laser diode far-field pattern measurement

Test system for laser diode far-field pattern measurement

US Patent 6922232 · Granted Jul 26, 2005

Estimated economic value: $118,000 ⓘ

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Lensless optical servo system for an optically assisted disk drive2009
Lensless optical servo system for an optically assisted disk drive2004
Multibeam laser servowriting of magnetic data storage media2004
Monolithic optical pickup and an assembly including the pickup with laser source2004
Mismatching of gratings to achieve phase shift in an optical position detector2003
Multibeam laser servowriting of magnetic data storage media2002
Holographic optical element with castellated aperture2000
Optical servo system for magnetic disk1996
Optical servo system for magnetic disk1992
Magneto-optical information storage system for flexible media having maximum ove1992
Optical read/write storage system for flexible media having bernoulli stabilizat1991