Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Electronic systems testing employing embedded serial scan generator

Electronic systems testing employing embedded serial scan generator

US Patent 6920416 · Granted Jul 19, 2005

Estimated economic value: $23,030,000 ⓘ

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Synchronizing a device that has been power cycled to an already operational syst2024
Systems and methods for controlling access to secure debugging and profiling fea2023
Synchronizing a device that has been power cycled to an already operational syst2023
Operating state machine controllers after powering, decoupling, monitoring, coup2021
TCKC/TMSC counter, gating circuitry for selection, deselection, technology speci2020
Series equivalent scans across multiple scan topologies2020
Detecting power supply sag in an integrated circuit2020
Pipeline processor data and attribute register, secure emulation logic, gating2019
Monitoring communication link in powered-up device for synchronization point seq2019
Adapter circuitry with link and system interfaces to core circuitry2018
Detecting power supply sag in an integrated circuit2018
TCK, TMS(C) clock, gating circuitry providing selection and deselection outputs2018