Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Zero-temperature-gradient zero-bias thermally stimulated current technique to characterize defects in semiconductors or insulators

Zero-temperature-gradient zero-bias thermally stimulated current technique to characterize defects in semiconductors or insulators

US Patent 6909273 · Granted Jun 21, 2005

Estimated economic value: $140,000 ⓘ

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Cancellation circuit using digital to time converter2025
Radio-frequency front end with power amplifier detuning to reduce output degrada2020
Bias current generator having blended temperature response2018
Current comparator2017
On-chip R-C time constant calibration2009
Zero-temperature-gradient zero-bias thermally stimulated current technique to ch2006
Circuitry for reducing leakage currents in a transmission gate switch using very2005
Circuits for reducing leakage currents in pull-up and pull-down circuits using v2005
Circuitry for reducing leakage currents in a pre-charge circuit using very small2004
Method of fabricating improved capacitors with pinhole repair consideration when2002
Voltage sample and hold circuit for low leakage charge pump2001