Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Semiconductor integrated circuit device including semiconductor memory with tester circuit capable of analyzing redundancy repair

Semiconductor integrated circuit device including semiconductor memory with tester circuit capable of analyzing redundancy repair

US Patent 6895537 · Granted May 17, 2005

Estimated economic value: $82,000 ⓘ

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Positioning apparatus2025
Automatic driving control system and automatic driving control method2017
Nonvolatile semiconductor memory device performing data writing in a toggle mann2010
Semiconductor device improving error correction processing rate2009
Nonvolatile semiconductor memory device capable of uniformly inputting/outputtin2007
Semiconductor memory device reduced in power consumption during burn-in test2005
Method of erasing information in non-volatile semiconductor memory device2005
Semiconductor memory device for improvement of defective data line relief rate2005
Nonvolatile semiconductor memory device capable of uniformly inputting/outputtin2005
Non-volatile semiconductor memory device having a memory cell which stably retai2004
Non-volatile semiconductor memory device capable of rapid operation2004
Semiconductor memory device2004