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Home › Method and apparatus for determining critical timing path sensitivities of macros in a semiconductor device

Method and apparatus for determining critical timing path sensitivities of macros in a semiconductor device

US Patent 6889369 · Granted May 3, 2005

Estimated economic value: $6,581,000 ⓘ

Assignee

Inventors

Terence M. Clifton (1 patents)
Patrick O'Connell (3 patents)
Spencer A. Petersen (1 patents)

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