Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Mass spectrometer for simultaneous detection of reflected and direct ions

Mass spectrometer for simultaneous detection of reflected and direct ions

US Patent 6844544 · Granted Jan 18, 2005

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Systems and methods of rapid and autonomous detection of aerosol particles2024
Methods and systems for detecting aerosol particles2024
Systems and methods of rapid and autonomous detection of aerosol particles2023
Time of flight mass spectrometer coupled to a core sample source2021
Time of flight mass spectrometer coupled to a core sample source2021
Miniature time-of-flight mass spectrometer2019
Miniature time-of-flight mass spectrometer2019
Miniature time-of-flight mass spectrometer2017
Miniature time-of-flight mass spectrometer2017
Combined chemical/biological agent detection system and method utilizing mass sp2007
Time- of flight mass spectrometers for improving resolution and mass employing a2006
Gating grid and method of making same2005