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Home › METHOD OF MEASURING A CHARACTERISTIC OF A CAPACITIVE TYPE OF SENSOR, A SENSOR CHARACTERISTIC MEASURING APPARATUS, A CAPACITIVE TYPE OF SENSOR APPARATUS, AND AN IC CHIP FOR MEASURING A SENSOR CHARACTERISTIC

METHOD OF MEASURING A CHARACTERISTIC OF A CAPACITIVE TYPE OF SENSOR, A SENSOR CHARACTERISTIC MEASURING APPARATUS, A CAPACITIVE TYPE OF SENSOR APPARATUS, AND AN IC CHIP FOR MEASURING A SENSOR CHARACTERISTIC

US Patent 6809527 · Granted Oct 26, 2004

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