Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Method for identifying test points to optimize the testing of integrated circuits using a genetic algorithm

Method for identifying test points to optimize the testing of integrated circuits using a genetic algorithm

US Patent 6782515 · Granted Aug 24, 2004

Estimated economic value: $4,632,000 ⓘ

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Encapsulated gear train for a machine2023
Method and system for improving efficiency of sequential test compression using 2017
Elastic compression-optimizing tester bandwidth with compressed test stimuli usi2016
Method and apparatus for handling fuse data for repairing faulty elements within2012
Mechanic's creeper2011
Apparatus and method for measuring a dimension of a workpiece2002
Recirculating lubrication system1980