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Home › Alternating current built in self test (AC BIST) with variable data receiver voltage reference for performing high-speed AC memory subsystem self-test

Alternating current built in self test (AC BIST) with variable data receiver voltage reference for performing high-speed AC memory subsystem self-test

US Patent 6757857 · Granted Jun 29, 2004

Estimated economic value: $8,425,000 ⓘ

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