Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Method and apparatus for in-circuit testing of sockets

Method and apparatus for in-circuit testing of sockets

US Patent 6734683 · Granted May 11, 2004

Estimated economic value: $33,328,000 ⓘ

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Low cost test for IC's or electrical modules using standard reconfigurable logic2008