Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Method and apparatus for simultaneous measurement of the refractive index and thickness of thin films

Method and apparatus for simultaneous measurement of the refractive index and thickness of thin films

US Patent 6731380 · Granted May 4, 2004

Assignee

No assignee recorded.

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Diagnosis of disease using laser-induced breakdown spectroscopy and machine lear2024
Methods and systems for diagnosing or monitoring progress of a pathology using l2019
Preparation of fluid samples for laser induced breakdown spectroscopy and/or ima2019
System and method for determining bilirubin levels in newborn babies2018
System and method for using stainless steel as a data archiving medium2016
System and method for using stainless steel as a data archiving medium2016
Fiber optics sound detector2011
Method for photo-curing polymerizable compositions with pulsed light2008
Method for photo-curing polymerizable compositions2008
Optical coupling device for single mode optical fibers2006
Photocuring device with axial array of light emitting diodes and method of curin2004
Device for curing photosensitive dental compositions with off-axis lens and meth2003