Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Test circuit for an analog measurement of bit line signals of ferroelectric memory cells

Test circuit for an analog measurement of bit line signals of ferroelectric memory cells

US Patent 6711047 · Granted Mar 23, 2004

Estimated economic value: $78,000 ⓘ

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Method and reactor for manufacturing particles2025
Rotary dryer star and method for treating solid particles2018
Fluidizing device2018
Oil sump having oil filter2017
Method for production of particles of pharmaceutical substances and the use ther2015
Method and apparatus for the treatment of fine-grained material in a spouted bed2015
Method for production of particles of pharmaceutical substances and the use ther2015
Method for production of particles of pharmaceutical substances particles of pha2013
Fan drive2012
Drive device with override function2012
Method for production of enzyme granules and enzyme granules produced thus2012
Use of a nozzle for manufacturing sodium percarbonate2012