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Home › Array-built-in-self-test (ABIST) for efficient, fast, bitmapping of large embedded arrays in manufacturing test

Array-built-in-self-test (ABIST) for efficient, fast, bitmapping of large embedded arrays in manufacturing test

US Patent 6643807 · Granted Nov 4, 2003

Estimated economic value: $11,371,000 ⓘ

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