Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Asynchronous FIFO memory having built-in self test logic

Asynchronous FIFO memory having built-in self test logic

US Patent 6611469 · Granted Aug 26, 2003

Estimated economic value: $47,542,000 ⓘ

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Method and system for generating a display2015
Method and system for generating a display2014
Methods and apparatus to decode dual-tone signals2013
Method and circuit for controlling operation of a light-emitting diode2010
Method and system for rapidly starting up an IEEE 1394 network2009
Linking addressable shadow port and protocol for serial bus networks2008
Linking addressable shadow port and protocol for serial bus networks2008
Linking addressable shadow port and protocol for serial bus networks2007
Linking addressable shadow port and protocol for serial bus networks2007
Linking addressable shadow port and protocol for serial bus networks2005
Linking addressable shadow port and protocol for serial bus networks2005
Circuits, systems, and methods for efficient wake up of peripheral component int2002