Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Circuit configuration and method for determining a time constant of a storage capacitor of a memory cell in a semiconductor memory

Circuit configuration and method for determining a time constant of a storage capacitor of a memory cell in a semiconductor memory

US Patent 6600680 · Granted Jul 29, 2003

Estimated economic value: $176,000 ⓘ

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Integrated circuits with tungsten interconnect liners2025
Dielectric sidewall features for tuning thin film transistor (TFT) parasitics2025
Aluminum alloy, method for producing an engine component, engine component, and 2025
Low defect, high mobility thin film transistors with in-situ doped metal oxide c2025
Multilevel wordline assembly for embedded DRAM2025
Capacitor connections in dielectric layers2025
Passivation layers for thin film transistors2025
Decoupling capacitors and methods of fabrication2025
Two transistor memory cell using stacked thin-film transistors2025
Planar buried channel structure integrated with non-planar structures2025
Three-dimensional capacitors with double metal electrodes2024
Through plate interconnect for a vertical MIM capacitor2024