Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Partitionable embedded circuit test system for integrated circuit

Partitionable embedded circuit test system for integrated circuit

US Patent 6587979 · Granted Jul 1, 2003

Estimated economic value: $8,092,000 ⓘ

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Heatable device for use with a vehicle mounted image acquisition unit2025
Heatable device for use with a vehicle-mounted image acquisition unit2022
In-line treatment of hydrocarbon fluids with ozone2014
Test systems and methods for testing electronic devices2013
In-line treatment of hydrocarbon fluids with ozone2011
Tire pressure monitoring system having a collapsible casing2010
Test system for integrated circuits with serdes ports2006
Field programmable gate array with program encryption2002
Field programmable gate array with program encryption2002
Field programmable gate array with program encryption2002
Built-in spare row and column replacement analysis system for embedded memories2001
Built-in spare row and column replacement analysis system for embedded memories2001