Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Method and apparatus for measuring thickness of transparent films

Method and apparatus for measuring thickness of transparent films

US Patent 6545765 · Granted Apr 8, 2003

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Method for guiding a missile, missile controller and missile2024
Optical scanning microscope and examination method2023
Microscope and method for optically examining and/or manipulating a microscopic 2021
Method for imaging in a microscope with oblique illumination2020
Microscope illumination method and microscope2016
Microscope illumination method and microscope2016
Microscope illumination method and microscope2016
Microscope illumination system, microscope and oblique incident illumination met2016
Illuminating arrangement for a microscope2015
Device for focusing a microscope objective on a sample2015
Fluorescence microscope having an illumination device2014
Fluorescence microscope having an illumination device2014