Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Apparatus and method for continuity testing of pogo pins in a probe

Apparatus and method for continuity testing of pogo pins in a probe

US Patent 6541992 · Granted Apr 1, 2003

Estimated economic value: $55,000 ⓘ

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Methods for genotype-independent nuclear and plastid transformation coupled with2000
Tools for positioning semiconductor chip test probes2000