Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Method and system for local index measurement in optical materials

Method and system for local index measurement in optical materials

US Patent 6525808 · Granted Feb 25, 2003

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Imaging system and depth detection system combining light-field imaging and stru2025
Quantum meta-device for ultrasensitive displacement metrology2025
Metasurface based device for generating abrupt autofocusing beam2024
Metalens for light field imaging2023
Harmonic light-generating metasurface2022
Broadband meta-optical device2021
Broadband achromatic metalens in the visible spectrum2021
Material for expanding the range of light absorption in an original constitution2015
Image-based refractive index measuring system2015
Gamma dose rate measurement system2014
Method for measuring propagation loss in a plane light guide plate2014
Non-visible particle detection based on smart phone2014