Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Test circuit for semiconductor device with multiple memory circuits

Test circuit for semiconductor device with multiple memory circuits

US Patent 6516430 · Granted Feb 4, 2003

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Apparatus and method for masking input of invalid data strobe signal2011
Memory circuit testing system, semiconductor device, and memory testing method2009
Trimming circuit for system integrated circuit2001
Semiconductor memory device with precharge voltage correction circuit2000
Semiconductor circuit with reduced P-N junction capacitance1998
EEPROM and EEPROM reading method1995
Semiconductor memory device1995
Differential amplification circuit1994
Semiconductor memory device having a plurality of selectively activated data bus1993
Logic operation circuit1992
Programmable logic device having expanded logic capability1991