Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Test system including a test head with integral device for generating and measuring output having variable current or voltage characteristics

Test system including a test head with integral device for generating and measuring output having variable current or voltage characteristics

US Patent 6489797 · Granted Dec 3, 2002

Estimated economic value: $7,994,000 ⓘ

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Investor controlled risk matrix2019
System and method for thermal limit control2011
Electrosurgery pencil2011
System and method for mapping system transfer functions2010
Mixed signal device under test board interface2003
Method of forming waterproof stitched connections during shoe manufacture1999
Active vibration control systems1993