{"@context": "https://schema.org", "@type": "BreadcrumbList", "itemListElement": [{"@type": "ListItem", "position": 1, "name": "Home", "item": "https://www.patentleaderboard.com/"}, {"@type": "ListItem", "position": 2, "name": "Methods for converting features to a uniform micron technology in an integrated circuit design and apparatus for doing the same", "item": "https://www.patentleaderboard.com/patent/6470477"}]}
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Home › Methods for converting features to a uniform micron technology in an integrated circuit design and apparatus for doing the same

Methods for converting features to a uniform micron technology in an integrated circuit design and apparatus for doing the same

US Patent 6470477 · Granted Oct 22, 2002

Estimated economic value: $1,111,000 ⓘ

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