Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Method for quantifying the texture homogeneity of a polycrystalline material

Method for quantifying the texture homogeneity of a polycrystalline material

US Patent 6462339 · Granted Oct 8, 2002

Estimated economic value: $3,570,000 ⓘ

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Multi-block sputtering target with interface portions and associated methods and2020
Multi-block sputtering target with interface portions and associated methods and2016
Sodium / molybdenum metal articles and powder compacts2015
Tantalum and niobium billets and methods of producing the same2012
Methods for producing sodium/molybdenum power compacts2012
Powder metallurgy sputtering targets and methods of producing same2012
Powder metallurgy sputtering targets and methods of producing same2009
High purity tantalum, products containing the same, and methods of making the sa2009
Tantalum and niobium billets and methods of producing the same2009
Hollow cathode target and methods of making same2008
High purity tantalum, products containing the same, and methods of making the sa2008
Method of forming sputtering articles by multidirectional deformation2007