Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Method for delay line linearity testing

Method for delay line linearity testing

US Patent 6437553 · Granted Aug 20, 2002

Estimated economic value: $11,226,000 ⓘ

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Rock analysis apparatus and method2013
Providing data2010
Efficient and flexible multi-bit halftoning2009
Laser diode modulator and method of controlling laser diode modulator2008
Methods and apparatus for selecting image enhancement techniques2008
Method of time-in-service reliability concern resolution2008
Resolution enhancement apparatus, systems, and methods2007
Supporting multiple print engine configurations through compatible delay window 2006
Clock adjustment2006
Scaling an image2006
Method and system for image processing including mixed resolution, multi-channel2005
System and method for clock independent pulse width modulation2005