Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Method for testing integrated circuit devices

Method for testing integrated circuit devices

US Patent 6392423 · Granted May 21, 2002

Estimated economic value: $33,932,000 ⓘ

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Quantum dot radiation detection, systems and methods2015
Apparatus and method for testing integrated circuit devices2001
Apparatus and method for testing integrated circuit devices2001
Apparatus and method for testing integrated circuit devices2001
Method and apparatus for inspecting a display using a relatively low-resolution 2001
System for verifying signal timing accuracy on a digital testing device2001
Differential CMOS logic family1999
Chemical sensor and method1998
Probe device for detecting contaminants in subsurface media1996
CMOS power fet driver including multiple power MOSFET transistors connected in p1995
Method and apparatus for detecting hydrocarbon fuels in a vapor state with an ab1995
Sample-and-hold switch with low on resistance and reduced charge injection1992