Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Inspection and analyzing apparatus for semiconductor integrated circuit and inspection and analyzing method

Inspection and analyzing apparatus for semiconductor integrated circuit and inspection and analyzing method

US Patent 6374199 · Granted Apr 16, 2002

Estimated economic value: $15,000 ⓘ

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Tablets containing a 1-(β-D-glucopyranosyl)-3-(phenylthienylmethyl)benzene compo2017
Tablets quickly disintegrated in oral cavity2011
Data processing and management equipment and method for data analysis of particl2011
Failure analysis system of semiconductor memory device2005
Memory LSI failure analysis apparatus and analysis method thereof2005
Fault distribution analyzing system2002
Apparatus and method for analyzing circuit test results and recording medium sto2001
Failure analyzer with distributed data processing network and method used therei2000
Specific part searching method and device for memory LSI1999
Automatic LSI testing apparatus using expert system1996
Process for producing porous film or sheet1984
Polyolefin resin composition and method for making polyolefin film1980