Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › System and method for detecting defects within an electrical circuit by analyzing quiescent current

System and method for detecting defects within an electrical circuit by analyzing quiescent current

US Patent 6366108 · Granted Apr 2, 2002

Estimated economic value: $20,288,000 ⓘ

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Tool setting device and method of transferring scaled setting information to a t2018
Urinary device having antiseptic and health testing properties2016
Tiered integrated circuit assembly and a method for manufacturing the same2013
Configurable memory sheet and package assembly2013
Method for facilitating the stacking of integrated circuits having different are2012
Test system and method for parallel modulation error measurement of transceivers2009
Simulation-based method for estimating leakage currents in defect-free integrate2001
System and method for modelling integrated circuit bridging faults1997
Microbial culture having catechol 1,2-oxygenase activity1991
Production of hexamethylenediamine muconate salt1990
Waterbed mattress1990
Process for the production of muconic acid1988