Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Characteristics evaluation circuit for semiconductor wafer and its evaluation method

Characteristics evaluation circuit for semiconductor wafer and its evaluation method

US Patent 6346820 · Granted Feb 12, 2002

Estimated economic value: $25,000 ⓘ

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Semiconductor memory device including power supply line2016
Semiconductor device having compensation capacitance2014
Semiconductor device2014
Semiconductor device2014
Semiconductor device having circuit blocks with mutually the same circuit config2011
Semiconductor integrated circuit device2009
Process for the production of tert-butyl N-(2-bromoethyl)carbamate2008