Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › High speed optical inspection apparatus using Gaussian distribution analysis and method therefore

High speed optical inspection apparatus using Gaussian distribution analysis and method therefore

US Patent 6252242 · Granted Jun 26, 2001

Assignee

No assignee recorded.

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Detection scheme for particle size and concentration measurement2025
Detection scheme for particle size and concentration measurement2021
Drift correction method for infrared imaging device2018
Single device for gas and flame detection, imaging and measurement, and drift co2018
Drift correction method for infrared imaging device2018
Optical inspection system with polarization isolation of detection system reflec2013
Optical inspection system with polarization isolation of detection system reflec2013
Time dependent fluorescence measurements2010
Method for particle size and concentration measurement2010
Scatterometer-interferometer and method for detecting and distinguishing charact2010
Scatterometer-interferometer and method for detecting and distinguishing charact2010
Measuring time dependent fluorescence2009