Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Method and apparatus for thickness measurement using microwaves

Method and apparatus for thickness measurement using microwaves

US Patent 6198293 · Granted Mar 6, 2001

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Rate of penetration/depth monitor for a borehole formed with millimeter-wave bea2025
Passive millimeter wave radiometer system for calibration of infrared cameras2020
Regenerator for syngas cleanup and energy recovery in gasifier systems2019
Microwave plasma apparatus and method for materials processing2018
Pressurized plasma enhanced reactor and methods for converting organic matter to2017
Regenerator for syngas cleanup and energy recovery in gasifier systems2016
Pressurized plasma enhanced reactor2015
High pressure gasifier system using electrically assisted heating2015
Microwave plasma apparatus and method for materials processing2014
Regenerator for syngas cleanup and energy recovery in gasifier systems2013
Directed energy melter2013
Directed energy melter2013