Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Sample shape determination by measurement of surface slope with a scanning electron microscope

Sample shape determination by measurement of surface slope with a scanning electron microscope

US Patent 6157032 · Granted Dec 5, 2000

Estimated economic value: $227,179,000 ⓘ

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Area camera substrate pre-aligner2025
Substrate mapping using deep neural-networks2024
Electron beam sterilization apparatus2014
Electron beam sterilization apparatus2012
Removing noise caused by artifacts from a digital image signal2003
Boat speed control2003
Magnetic lens for focusing a charged particle beam2002
Removing noise caused by artifacts from a digital image signal2001
Method and apparatus for measuring registration between layers of a semiconducto1990