{"@context": "https://schema.org", "@type": "BreadcrumbList", "itemListElement": [{"@type": "ListItem", "position": 1, "name": "Home", "item": "https://www.patentleaderboard.com/"}, {"@type": "ListItem", "position": 2, "name": "Method and apparatus for monitoring computer systems during manufacturing, testing and in the field", "item": "https://www.patentleaderboard.com/patent/6138249"}]}
Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Method and apparatus for monitoring computer systems during manufacturing, testing and in the field

Method and apparatus for monitoring computer systems during manufacturing, testing and in the field

US Patent 6138249 · Granted Oct 24, 2000

Estimated economic value: $673,404,000 ⓘ

Assignee

Inventors

View full patent text on Google Patents →