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Home › Method and apparatus for performing on-chip function checks and locating detected anomalies within a nested time interval using CRCs or the like

Method and apparatus for performing on-chip function checks and locating detected anomalies within a nested time interval using CRCs or the like

US Patent 6105155 · Granted Aug 15, 2000

Estimated economic value: $26,064,000 ⓘ

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