Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Method and apparatus for testing RFID tags

Method and apparatus for testing RFID tags

US Patent 6104291 · Granted Aug 15, 2000

Estimated economic value: $1,030,000 ⓘ

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Electronic substrate stacking2024
Microelectronics H-frame device2024
RF modules with an enclosure having a micromachined interior using semiconductor2024
Channelized filter using semiconductor fabrication2024
Two-junction photovoltaic devices2024
Current mode signal path of an integrated radio frequency pulse generator2024
Radio frequency crossover with high isolation in microelectronics H-frame device2024
Variable capacitor devices with differential voltage control2024
Channelized filter using semiconductor fabrication2023
Two-junction photovoltaic devices2023
Low voltage signal path in a radio frequency signal generator2023
Metamorphic two-junction photovoltaic devices with removable graded buffers2023